IEEE Access · Journal
Bare-Metal Firmware Fuzzing: A Survey of Techniques and Approaches
Asmita Asmita, Ryan Tsang, Sujan Ghimire, Soheil Salehi, Houman Homayoun
Cite
Asmita Asmita, Ryan Tsang, Sujan Ghimire, Soheil Salehi, Houman Homayoun, "Bare-Metal Firmware Fuzzing: A Survey of Techniques and Approaches," IEEE Access, vol. 13, pp. 98253-98277, 2025. doi: 10.1109/ACCESS.2025.3575691.
BibTeX
@article{asmita2025bare,
title = {{Bare-Metal Firmware Fuzzing: A Survey of Techniques and Approaches}},
author = {Asmita Asmita and Ryan Tsang and Sujan Ghimire and Soheil Salehi and Houman Homayoun},
journal = {IEEE Access},
year = {2025},
volume = {13},
pages = {98253--98277},
publisher = {IEEE},
doi = {10.1109/ACCESS.2025.3575691}
}