HWREx — Hardware Weakness and Vulnerability Exploration
A research framework that makes hardware vulnerability knowledge accessible through natural-language queries, semantic similarity, and LLM-assisted mitigation suggestions.
- Research
- AI/ML
- Security Tools
Problem
Information about hardware weaknesses, vulnerabilities, and their mitigations is distributed across many records and is difficult for hardware designers and security engineers to search effectively.
Technical approach
- 01Accept natural-language queries describing a hardware design concern.
- 02Retrieve related hardware weakness and vulnerability records using semantic similarity.
- 03Present the associated risk information and mitigation guidance in an explorable, narrative form.
- 04Use large language models to assist with mitigation suggestions.
01
Natural-language query
Design or security concern
02
Semantic retrieval
Similarity over vulnerability records
03
Risk exploration
Related weaknesses & context
04
Mitigation
LLM-assisted suggestions
My contributions
- Lead author of the HWREx article in ACM Transactions on Design Automation of Electronic Systems (2025).
- Co-author of the related LLM-HyPZ workshop paper on LLM-assisted hardware vulnerability discovery (IEEE ICDMW 2025).
Associated publications
LLM-HyPZ: Hardware Vulnerability Discovery Using an LLM-Assisted Hybrid Platform for Zero-Shot Knowledge Extraction and Refinement
Yu-Zheng Lin, Sujan Ghimire, Abhiram Nandimandalam, Jonah Michael Camacho, Unnati Tripathi, Rony Macwan, Sicong Shao, Setareh Rafatirad, Rozhin Yasaei, Pratik Satam, Soheil Salehi
2025 IEEE International Conference on Data Mining Workshops (ICDMW), pp. 1268-1273, 2025.
HWREx: AI-enabled Hardware Weakness and Risk Exploration and Storytelling Framework with LLM-assisted Mitigation Suggestion
Sujan Ghimire, Yu-Zheng Lin, Muntasir Mamun, Muhtasim Alam Chowdhury, Farhad Alemi, Shuyu Cai, Jinduo Guo, Mingyu Zhu, Honghui Li, Banafsheh Saber Latibari, Setareh Rafatirad, Pratik Satam, Soheil Salehi
ACM Transactions on Design Automation of Electronic Systems, vol. 30, no. 6, pp. 1-33, 2025.